Interference Microscope - メーカー・企業と業務用製品 | イプロスものづくり

Interference Microscopeの製品一覧

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Optical microscope transmission phase-shift laser interference microscope

Optical microscope transmission phase-shifting laser interference microscope

This is a new type of microscope positioned above conventional optical microscopes, capable of measuring refractive index distribution and thickness structure quickly and quantitatively, and visualizing it in three dimensions. 【Features】 ○ By applying laser interference methods, it can non-contact measure the refractive index and height of samples. ○ High speed… measurement time is a few seconds ○ High precision… phase measurement accuracy ±(1/150) λ, refractive index difference measurement accuracy ±0.0001, height measurement accuracy ±0.2μm ○ Spatial resolution… equivalent to optical microscopes ● For more details, please contact us or download the catalog.

企業：エフケー光学研究所
価格：Other

Optical microscope
Interference Microscope

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[Processing Example] Measurement of the processed surface using a white light interference microscope.

Wide measurement range exceeding mm units! Measurement examples of polycrystalline ceramics and SiC single crystals.

We would like to introduce a case study of surface measurement using the newly introduced white light interference microscope at our company. The white light interference microscope is a type of microscope that utilizes the phenomenon of light interference to measure and analyze "surface shape." It accommodates surface roughness and line roughness through 3D measurement, regardless of the material being measured. In the measurement of the wire slice surface and polishing surface of polycrystalline ceramics, the results were as follows: slice surface Sa 0.8446 μm, lapping surface Sa 0.2506 μm, and polishing surface Sa 0.00583 μm. Additionally, in the measurement of the polishing surfaces of SiC single crystal and SUS316L, the results were: SiC single crystal Sa 0.000458 μm and SUS316L Sa 0.000302 μm. 【Features of the White Light Interference Microscope】 ■ Non-contact & Surface Measurement - No restrictions on the material being measured - Accommodates surface roughness and line roughness through 3D measurement ■ Wide Measurement Range & High Resolution Measurement - Wide in-plane measurement range exceeding millimeter units - Height resolution of 0.01nm *For more details, please refer to the PDF document or feel free to contact us.